000 01457cam a2200349 a 4500
001 12825874
005 20241120130539.0
008 020620s2003 nyu b 001 0 eng
010 _a 2002026733
020 _a0471149772 (cloth : alk. paper)
_qpaperback
040 _aDLC
_cDLC
_dDLC
_beng
_erda
043 _an-us---
050 0 0 _aLB3051
_b.K8 2003
082 0 0 _a371.26/0973 KUB
_221
100 1 _aKubiszyn, Tom.
245 1 0 _aEducational testing and measurement :
_bclassroom application and practice /
_cTom Kubiszyn, Gary Borich.
250 _a7th ed.
264 _aNew York
_bJohn Wiley & Sons
_c2003
300 _axv, 508 p. ;
_c25 cm.
_bcolour illustrations ;
336 _2rdacontent
_atext
337 _2rdamedia
_aunmediated
338 _2rdacarrier
_avolume
504 _aIncludes bibliographical references (p. 484-494) and index.
650 0 _aEducational tests and measurements
_zUnited States.
700 1 _aBorich, Gary D.
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/wiley036/2002026733.html
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/toc/wiley023/2002026733.html
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/enhancements/fy0613/2002026733-b.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
942 _2ddc
_cBK
999 _c20883
_d20883